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Tackling Characterization Challenges in High Deformation/Stress Steel Alloys Using Transmission Kikuchi Diffraction (TKD)

Published online by Cambridge University Press:  23 September 2015

Amir Avishai ,
Kevin Abbasi ,
Danqi Wang ,
Nanthawan Avishai ,
Dandan Wu ,
Vikram Bedekar ,
Scott Hyde ,
Scott Sitzman  and
Arthur Heuer
Amir Avishai
Affiliation:
Swagelok Center for Surface Analysis of Materials, Case Western Reserve University, Cleveland, OH, USA
Kevin Abbasi
Affiliation:
Swagelok Center for Surface Analysis of Materials, Case Western Reserve University, Cleveland, OH, USA
Danqi Wang
Affiliation:
Swagelok Center for Surface Analysis of Materials, Case Western Reserve University, Cleveland, OH, USA
Nanthawan Avishai
Affiliation:
Swagelok Center for Surface Analysis of Materials, Case Western Reserve University, Cleveland, OH, USA
Dandan Wu
Affiliation:
Timken Technology Center, 4500 MT Pleasant Rd NW, N Canton OH, USA
Vikram Bedekar
Affiliation:
Timken Technology Center, 4500 MT Pleasant Rd NW, N Canton OH, USA
Scott Hyde
Affiliation:
Timken Technology Center, 4500 MT Pleasant Rd NW, N Canton OH, USA
Scott Sitzman
Affiliation:
Oxford Instruments America, Inc., Concord, MA, USA
Arthur Heuer
Affiliation:
Swagelok Center for Surface Analysis of Materials, Case Western Reserve University, Cleveland, OH, USA Dept. of Mat. Sci. and Eng., Case Western Reserve University, Cleveland, OH, USA

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 2377 - 2378
Copyright
Copyright © Microscopy Society of America 2015 

References

References:

[1] Evans, M.H., Material Science and Technology Vol 28(No 1 (2012). p 3–22.Google Scholar
[2] Bedekar, V. M., et. al., Microscopy and Microanalysis 18(Supplement S2, p 1778.Google Scholar
[3] Wang, D., et. al., Metal Mater Trans A 45 (2014). p 3578.Google Scholar
[4] Trimby, P.W., et. al., Acta Materialia 62 (2014). p 69.CrossRefGoogle Scholar
[5] Avishai, A., et. al., Microscopy and Microanalysis 20(Suppl. 3, Aug 2014). p 1476.Google Scholar
[6] Wu, D., et. al., Microscopy and Microanalysis 19(Supplement S2, Aug 2013). p 694.Google Scholar
[7] The authors would like to acknowledge the support of Brandon Van Leer and Rick Passy of FEI..Google Scholar