Hostname: page-component-586b7cd67f-r5fsc Total loading time: 0 Render date: 2024-11-29T13:12:41.848Z Has data issue: false hasContentIssue false
  • English
  • Français

Studying Tomorrow's Materials Today: Insights with Quantitative STEM, EELS

Published online by Cambridge University Press:  27 August 2014

G. A. Botton ,
M. Bugnet ,
K.J. Dudeck ,
N. Gauquelin ,
H. Liu ,
S. Prabhudev ,
A. Scullion ,
S. Stambula ,
S.Y. Woo  and
G.-Z. Zhu
...Show all authors
G. A. Botton
Affiliation:
Department of Materials Science and Engineering, McMaster University, Hamilton, ON, Canada
M. Bugnet
Affiliation:
Department of Materials Science and Engineering, McMaster University, Hamilton, ON, Canada
K.J. Dudeck
Affiliation:
Department of Materials Science and Engineering, McMaster University, Hamilton, ON, Canada
N. Gauquelin
Affiliation:
Department of Materials Science and Engineering, McMaster University, Hamilton, ON, Canada Now at EMAT, University of Antwerp, Antwerp, Belgium
H. Liu
Affiliation:
Department of Materials Science and Engineering, McMaster University, Hamilton, ON, Canada
S. Prabhudev
Affiliation:
Department of Materials Science and Engineering, McMaster University, Hamilton, ON, Canada
A. Scullion
Affiliation:
Department of Materials Science and Engineering, McMaster University, Hamilton, ON, Canada
S. Stambula
Affiliation:
Department of Materials Science and Engineering, McMaster University, Hamilton, ON, Canada
S.Y. Woo
Affiliation:
Department of Materials Science and Engineering, McMaster University, Hamilton, ON, Canada
G.-Z. Zhu
Affiliation:
Department of Materials Science and Engineering, McMaster University, Hamilton, ON, Canada
H.P.T. Nguyen
Affiliation:
Department of Electrical and Computer Engineering, McGill University, Montreal, QC, Canada
Z. Mi
Affiliation:
Department of Electrical and Computer Engineering, McGill University, Montreal, QC, Canada

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 78 - 79
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Stambula, S., et al., Journal of Physical Chemistry C, on-line (2014), DOI: 10.1021/jp408979h.Google Scholar
[2] Prabhudev, S., et al., ACS Nano 7, 6103-6110 (2013).Google Scholar
[3] Chan, M.C.Y., et al, Nanoscale 4 (22), 7273-7279 (2012).Google Scholar
[4] Dudeck, K.J., et al., Physical Review Letters, Physical Review Letters, 110, 166102 (2013).Google Scholar
[5] Dudeck, K.J., et al., Semiconductor Science and Technology, 28, 125012 (2013).Google Scholar
[6] Radtke, G., et al., Physical Review В 87, 205309 (2013.Google Scholar
[7] Woo, S.Y. et al, to be submitted.Google Scholar
[8] The authors are grateful to NSERC for supporting this research. The microscopy was carried out at the Canadian Centre for Electron Microscopy, a National facility supported by NSERC and McMaster. We are grateful to Paolo Longo (Gatan Inc.) for the help in setting up the Quantum 966 spectrometer.Google Scholar