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Structural and Electronic Properties of Ti Doped ZnO: XRD, TEM, EELS and Ab-initio Simulations
Published online by Cambridge University Press: 04 August 2017
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- Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 1686 - 1687
- Copyright
- © Microscopy Society of America 2017
References
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[4] The result was developed within the CENTEM project no. CZ.1.05/2.1.00/03.0088, CENTEM PLUS (LO1402), CEDAMNF reg. no. CZ.02.1.01/0.0/0.0/15_003/0000358, co-funded by the ERDF and COST CZ LD15147.Google Scholar
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