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Streamlining Processing and Utilization of EM Data - An Efficient Open-source Solution

Published online by Cambridge University Press:  30 July 2020

Christoph Koch ,
Dieter Weber ,
Alexander Clausen ,
Andreas Mittelberger ,
Sherjeel Shabih ,
Johannes Müller ,
Benedikt Haas ,
Alberto Eljarrat ,
Jonas Weinrich  and
Chris Meyer
Christoph Koch
Affiliation:
Humboldt-Universität zu Berlin, Berlin, Berlin, Germany
Dieter Weber
Affiliation:
Forschungszentrum Jülich, Jülich, Nordrhein-Westfalen, Germany
Alexander Clausen
Affiliation:
Forschungszentrum Jülich, Jülich, Nordrhein-Westfalen, Germany
Andreas Mittelberger
Affiliation:
Nion, Kirkland, Washington, United States
Sherjeel Shabih
Affiliation:
Humboldt-Universität zu Berlin, Berlin, Berlin, Germany
Johannes Müller
Affiliation:
Humboldt-Universität zu Berlin, Berlin, Berlin, Germany
Benedikt Haas
Affiliation:
Humboldt-Universität zu Berlin, Berlin, Berlin, Germany
Alberto Eljarrat
Affiliation:
Humboldt-Universität zu Berlin, Berlin, Berlin, Germany
Jonas Weinrich
Affiliation:
Ferdinand-Braun-Institut Leibniz Institut für Höchstfrequenztechnik, Berlin, Berlin, Germany
Chris Meyer
Affiliation:
Nion, Kirkland, Washington, United States

Abstract

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Type
Advances in Modeling, Simulation, and Artificial Intelligence in Microscopy and Microanalysis for Physical and Biological Systems
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 2946 - 2948
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Copyright
Copyright © Microscopy Society of America 2020

References

Meyer, C., Dellby, N., Hachtel, J.A., Lovejoy, T., Mittelberger, A., and Krivanek, O., Microsc. Microanal. 25 (Suppl 2) (2019) 122; open-source project: https://nionswift.readthedocs.io/en/stable/ 10.1017/S143192761900134XCrossRefGoogle Scholar
The open-source LiberTEM project: https://libertem.github.io/LiberTEM/Google Scholar
eLabFTW, an open-source electronic lab notebook: https://www.elabftw.net/Google Scholar
Müller, J., Haas, B., Van den Broek, W., Fairman, S., and Koch, C.T., Proceedings of MC2019, IM5.004Google Scholar
Krivanek, O., Dellby, N., Hachtel, J.A., Idrobo, J.-C., Hotz, M.T., Plotkin-Swing, B., Bacon, N.J., Bleloch, A.L., Corbin, G.J., Hoffman, M.V., Meyer, C.E., Lovejoy, T.C., Ultramicroscopy 203 (2019) 6010.1016/j.ultramic.2018.12.006CrossRefGoogle Scholar
We thank Dr. Duc Dinh (Nagoya University, Japan) for the sample of AlN on m-plane sapphire and Prof. O. Benson and M. Rothe (Humboldt University, Berlin) for the sample of the Ag nanowire.Google Scholar