The movement towards a single platform concept for the operation of multi-functional analytical instruments has progressed over the past 10 years largely due to the availability of powerful computer technology combined with the need of ease of use to increase productivity. Other factors include the need to share data obtained from these increasingly complex instruments, and to transport these data in an easily managed format and the possibility of storing large amounts of data generated from projects.

Initial efforts in this field were generated by the need for computer control of complex instrumentation such as TEMs, EPMAs and dual beam instruments. Microprocessors enabled easy alignment, storage of stage parameters and digital image acquisition. with the boom in the semiconductor industry it was necessary to design tools that could be operated by individuals who did not possess the same amount of knowledge as the scientists and technologists of the previous generation. Early attempts at integration of techniques on a single platform were restricted, largely due to limitations in the capacity of the computers employed in controlling these tasks. Indeed, in some cases this actually increased the complexity of some instruments due to a profusion of microprocessors controlling the various analytical components of the larger analytical machines.