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Simultaneous Structural and Electrical Analysis of Vanadium Dioxide Using In Situ TEM

Published online by Cambridge University Press:  04 August 2017

Hessam Ghassemi
Affiliation:
Protochips Inc., 3800 Gateway Centre Blvd, Suite 306, Morrisville, NC 27560, U.S.A.
Ben Jacobs
Affiliation:
Protochips Inc., 3800 Gateway Centre Blvd, Suite 306, Morrisville, NC 27560, U.S.A.
Hasti Asayesh-Ardakani
Affiliation:
Department of Mechanical and Industrial Engineering, University of Illinois at Chicago, Chicago, IL 60607, U.S.A.
Wentao Yao
Affiliation:
Department of Mechanical and Industrial Engineering, University of Illinois at Chicago, Chicago, IL 60607, U.S.A.
Lucille A. Giannuzzi
Affiliation:
EXpressLO LLC, Lehigh Acres, FL 33971, USA
Reza Shahbazian-Yassar
Affiliation:
Department of Mechanical and Industrial Engineering, University of Illinois at Chicago, Chicago, IL 60607, U.S.A.

Abstract

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Type
Abstract
Copyright
© Microscopy Society of America 2017 

References

[1] Eyert, V. Ann Phys (Berlin) 11 2002). p. 650.Google Scholar
[2] Giannuzzi, L. A., et al, Microsc Microanal 21 2015). p. 1034.Google Scholar