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Simulated X-ray Spectra and X-ray Maps: Evaluation of Models Used in MC X-Ray Monte Carlo Simulation Program and Comparison with Experimental Data

Published online by Cambridge University Press:  23 November 2012

P. Michaud ,
R. Gauvin ,
H. Demers ,
N. Brodusch  and
M.J. Guinel
P. Michaud
Affiliation:
Department of Mining and Materials Engineering, McGill University, Montreal, Quebec, Canada
R. Gauvin
Affiliation:
Department of Mining and Materials Engineering, McGill University, Montreal, Quebec, Canada
H. Demers
Affiliation:
Department of Mining and Materials Engineering, McGill University, Montreal, Quebec, Canada
N. Brodusch
Affiliation:
Department of Mining and Materials Engineering, McGill University, Montreal, Quebec, Canada
M.J. Guinel
Affiliation:
University of Puerto Rico, San Juan, Puerto Rico
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 1022 - 1023
Copyright
Copyright © Microscopy Society of America 2012

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