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Silicon-standard-based Comparisons of LEAP Accuracy and Precision

Published online by Cambridge University Press:  30 July 2020

Ty Prosa
Ty Prosa*
Affiliation:
CAMECA Instruments Inc., Madison, Wisconsin, United States

Abstract

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Type
Collaborative Analysis Using Atom Probe Tomography Including TEM/APT Characterization of Metal Alloys and Other Material Systems
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 2084 - 2085
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Copyright
Copyright © Microscopy Society of America 2020

References

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