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Scanning Electron Microscopy Analysis of High Purity Libyan Desert Sandstone Silica Sand

Published online by Cambridge University Press:  30 July 2020

Nuri A. Zreiba
Affiliation:
Materials and Metallurgical Eng. Dept, University of Tripoli, Tripoli, Tripoli, Libya (E-mail: [email protected], [email protected])
Reda M. Dweiby
Affiliation:
Materials and Metallurgical Eng. Dept, University of Tripoli, Tripoli, Tripoli, Libya (E-mail: [email protected], [email protected])

Abstract

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High purity silica sand is an important commodity used for the processing of photovoltaic silicon for solar cells. The sand must meet very closely defined specifications related to its impurity content and particle size distribution. Scanning Electron Microscopy (SEM) is one of essential techniques used to characterize trace amounts of impurities and their distribution within individual sand particles. The objective of this work is to characterize the impurities present in high purity sandstone silica sand withdrawn from a deposit site located in southern part of Libyan Desert called Al-Shibat using imaging and analytical capabilities of SEM.

Type
Call of the Wild: Advances in Microanalysis and Microscopy of Geological and Extraterrestrial Materials
Copyright
Copyright © Microscopy Society of America 2020

References

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