Hostname: page-component-586b7cd67f-r5fsc Total loading time: 0 Render date: 2024-11-26T20:16:28.704Z Has data issue: false hasContentIssue false

Retrofittable Laser-free kHz to GHz Tunable Pulser for Ultra-fast Electron Microscopy

Published online by Cambridge University Press:  30 July 2020

Chunguang Jing
Affiliation:
Euclid Techlabs, LLC, Bolingbrook, Illinois, United States
Ao Liu
Affiliation:
Euclid Techlabs, LLC, Bolingbrook, Illinois, United States
Eric Montgomery
Affiliation:
Euclid Techlabs, LLC, Bolingbrook, Illinois, United States
Yubin Zhao
Affiliation:
Euclid Techlabs, LLC, Bolingbrook, Illinois, United States
Hyeokmin Choe
Affiliation:
Euclid Techlabs, LLC, Bolingbrook, Illinois, United States
Alexei Kanareykin
Affiliation:
Euclid Techlabs, LLC, Gaithersburg, Maryland, United States
June Lau
Affiliation:
National Institute of Standards and Technology, Gaithersburg, Maryland, United States
Xuewen Fu
Affiliation:
Brookhaven National Laboratory, Upton, New York, United States
Yimei Zhu
Affiliation:
Brookhaven National Laboratory, Upton, New York, United States

Abstract

Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Vendor Symposium - Imaging and Analysis
Copyright
Copyright © Microscopy Society of America 2020

References

Lobastov, VA, Srinivasan, R, Zewail, AH., Natl. Acad. Sci. 102 (2005) 70697073.10.1073/pnas.0502607102CrossRefGoogle Scholar
Flannigan, A. Zewail, , Accounts Chem. Res.,vol. 45, p. 1828 (2012).10.1021/ar3001684CrossRefGoogle Scholar
Zewail, , “Four-Dimensional Electron Microscopy”, Science, 328 (5975), pp. 187193 (2010).10.1126/science.1166135CrossRefGoogle ScholarPubMed
Kisielowski, C, et al. Discovering hidden material properties of MgCl2 at atomic resolution with structured temporal electron illumination of picosecond time resolution. Funct. Mater. 2019, 29, 1807818.10.1002/adfm.201807818CrossRefGoogle Scholar
Jing, , et al. , Tunable electron beam pulser for picoseconds stroboscopic microscopy in transmission electron microscopes, Ultramicroscopy, 207, December 2019, 11282910.1016/j.ultramic.2019.112829CrossRefGoogle ScholarPubMed
VandenBussche, Elisah J. and Flannigan, David J., Reducing Radiation Damage in Soft Matter with Femtosecond-Timed Single-Electron Packets, Nano Lett. 2019, 19, 66876694.10.1021/acs.nanolett.9b03074CrossRefGoogle ScholarPubMed
Lau, June W., et al. , Laser-free GHz stroboscopic TEM: components, system integration, and practical considerations for pump-probe measurements, invited paper, Sci. Inst. 2020, to appear.Google Scholar