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Resolving Nanostructured Materials Down to the Single-atom Limit

Published online by Cambridge University Press:  30 July 2020

Xiangbin Cai ,
Antonio Tricoli ,
Hongyang Liu ,
Yuan Cai ,
Christian Dwyer ,
Ning Wang  and
Ye Zhu
Xiangbin Cai
Affiliation:
Hong Kong University of Science and Technology, Hong Kong, Hong Kong
Antonio Tricoli
Affiliation:
Australian National University, Canberra, Australian Capital Territory, Australia
Hongyang Liu
Affiliation:
Chinese Academy of Sciences, Shenyang, Liaoning, China (People's Republic)
Yuan Cai
Affiliation:
Hong Kong University of Science and Technology, Hong Kong, Hong Kong
Christian Dwyer
Affiliation:
Arizona State University, Tempe, Arizona, United States
Ning Wang
Affiliation:
Hong Kong University of Science and Technology, Hong Kong, Hong Kong
Ye Zhu
Affiliation:
Hong Kong Polytechnic University, Hong Kong, Hong Kong

Abstract

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Type
Pushing the Limits of Detection in Quantitative (S)TEM Imaging, EELS, and EDX
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 1756 - 1758
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Copyright
Copyright © Microscopy Society of America 2020

References

Billinge, I. Levin, , Science 316, 561-565 (2007).10.1126/science.1135080CrossRefGoogle Scholar
Cai, et al. , Chemistry of Materials 31, 5769-5777 (2019).10.1021/acs.chemmater.9b01785CrossRefGoogle Scholar
Zhang, et al. , ACS Catalysis 9, 5998-6005 (2019).10.1021/acscatal.9b00601CrossRefGoogle Scholar
We acknowledge the financial assistance from the Research Grants Council of Hong Kong (Project Nos. 25301617 and N_HKUST624/19) and the facility support of JEOL JEM ARM 200F at the MCPF of HKUST.Google Scholar