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Research Grade Remote-Access Scanning Electron Microscopy: The Evolution of the Bugscope Project

Published online by Cambridge University Press:  24 July 2003

Glenn Fried ,
Scott Robinson ,
Don Appleman ,
Ben Grosser ,
Daniel Weber  and
Chas Conway
Glenn Fried
Affiliation:
Imaging Technology Group, Beckman Institute for Advanced Science and Technology, University of Illinois, UrbanaIL, 61801
Scott Robinson
Affiliation:
Imaging Technology Group, Beckman Institute for Advanced Science and Technology, University of Illinois, UrbanaIL, 61801
Don Appleman
Affiliation:
Imaging Technology Group, Beckman Institute for Advanced Science and Technology, University of Illinois, UrbanaIL, 61801
Ben Grosser
Affiliation:
Imaging Technology Group, Beckman Institute for Advanced Science and Technology, University of Illinois, UrbanaIL, 61801
Daniel Weber
Affiliation:
Imaging Technology Group, Beckman Institute for Advanced Science and Technology, University of Illinois, UrbanaIL, 61801
Chas Conway
Affiliation:
Imaging Technology Group, Beckman Institute for Advanced Science and Technology, University of Illinois, UrbanaIL, 61801

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 9 , Issue S02 , August 2003 , pp. 1258 - 1259
Copyright
Copyright © Microscopy Society of America 2003