Hostname: page-component-586b7cd67f-rdxmf Total loading time: 0 Render date: 2024-11-23T08:39:17.425Z Has data issue: false hasContentIssue false

Quantitative Mapping of Strain, Polarization, and Octahedral Distortion at unit cell resolution by Scanning Electron Diffraction

Published online by Cambridge University Press:  04 August 2017

Jim Ciston
Affiliation:
National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA, USA
Roberto dos Reis
Affiliation:
National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA, USA
Yifei Meng
Affiliation:
National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA, USA
Colin Ophus
Affiliation:
National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA, USA
Lane Martin
Affiliation:
Department of Materials Science and Engineering, University of California, Berkeley, CA, USA

Abstract

Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Copyright
© Microscopy Society of America 2017 

References

[1] LeBeau, J.M., Findlay, S.D., Allen, L.J., et al, Ultramicroscopy 110 2010). p. 118.Google Scholar
[2] Ophus, C., Ercius, P., Huijben, M. & Ciston, J. Applied Physics Letters 110 2017). p. 063102.Google Scholar
[3] LeBeau, J.M., D'Alfonso, A.J., Wright, N.J., et al, Applied Physics Letters 98 2011). p. 052904.Google Scholar
[4] Hwang, J., Zhang, J.Y., Son, J., et al, Applied Physics Letters 100 2012 191909.Google Scholar
[5] Gao, R., Dong, Y., Xu, H., et al, Applied Materials and Interfaces 8 2016). p. 14871.Google Scholar
[6] Kirkland, E.J. in Advanced computing in electron microscopy. Springer Science & Business Media 2010.Google Scholar
[7] Allen, L.J., D’Alfonso, A.J. & Findlay, S.D. Ultramicroscopy 151 2015). p. 11.Google Scholar
[8] Work at the Molecular Foundry was supported by the Office of Science, Office of Basic Energy Sciences, of the U. S. Department of Energy under Contract No. DE-AC02-05CH11231. JC, YM, and RdR acknowledge additional support from the U. S. Department of Energy Early Career Research Program..Google Scholar