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Quantitative Mapping of Strain, Polarization, and Octahedral Distortion at unit cell resolution by Scanning Electron Diffraction
Published online by Cambridge University Press: 04 August 2017
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- Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 434 - 435
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- © Microscopy Society of America 2017
References
[1]
LeBeau, J.M., Findlay, S.D., Allen, L.J., et al, Ultramicroscopy
110
2010). p. 118.Google Scholar
[2]
Ophus, C., Ercius, P., Huijben, M. & Ciston, J.
Applied Physics Letters
110
2017). p. 063102.Google Scholar
[3]
LeBeau, J.M., D'Alfonso, A.J., Wright, N.J., et al, Applied Physics Letters
98
2011). p. 052904.Google Scholar
[5]
Gao, R., Dong, Y., Xu, H., et al, Applied Materials and Interfaces
8
2016). p. 14871.Google Scholar
[6]
Kirkland, E.J. in Advanced computing in electron microscopy. Springer Science & Business Media
2010.Google Scholar
[8] Work at the Molecular Foundry was supported by the Office of Science, Office of Basic Energy Sciences, of the U. S. Department of Energy under Contract No. DE-AC02-05CH11231. JC, YM, and RdR acknowledge additional support from the U. S. Department of Energy Early Career Research Program..Google Scholar
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