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Quantitative Chemical Mapping of Engineered Interfaces in Quaternary III-V Semiconductor Heterostructures Using Phase Retrieval High Resolution Transmission Electron Microscopy

Published online by Cambridge University Press:  03 August 2008

K Mahalingam ,
HJ Haugan ,
GJ Brown  and
KG Eyink
K Mahalingam
Affiliation:
Air Force Research Laboratory
HJ Haugan
Affiliation:
Air Force Research Laboratory
GJ Brown
Affiliation:
Air Force Research Laboratory
KG Eyink
Affiliation:
Air Force Research Laboratory
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Type
Research Article
Information
Microscopy and Microanalysis , Volume 14 , Supplement S2 , August 2008 , pp. 408 - 409
Copyright
© 2008 Microscopy Society of America

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