Hostname: page-component-586b7cd67f-l7hp2 Total loading time: 0 Render date: 2024-11-27T03:46:19.825Z Has data issue: false hasContentIssue false
  • English
  • Français

Quantification of Thermal Interface Resistance Using Atomic Scale Debye-Waller Thermometry

Published online by Cambridge University Press:  30 July 2020

Menglin Zhu  and
Jinwoo Hwang
Menglin Zhu
Affiliation:
Department of Materials Science and Engineering, The Ohio State University, Columbus, Ohio, United States
Jinwoo Hwang
Affiliation:
Department of Materials Science and Engineering, The Ohio State University, Columbus, Ohio, United States

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Pushing the Limits of Detection in Quantitative (S)TEM Imaging, EELS, and EDX
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 960 - 962
Check for updates
Copyright
Copyright © Microscopy Society of America 2020

References

Krivanek, O.L. et al. , Nature 514, 209–212 (2014).10.1038/nature13870CrossRefGoogle Scholar
Tate, M. W., et al. , Microsc. Microanal. 22, 237 (2016).10.1017/S1431927615015664CrossRefGoogle Scholar
Rezikyan, A., et al. , Microsc. Microanal. 21, 1455–1474 (2015).10.1017/S1431927615015135CrossRefGoogle Scholar
Yankovich, A.B., et al. , Nat. Commun. 5, 4155 (2014).10.1038/ncomms5155CrossRefGoogle Scholar
Vijayan, S. et al. , Ultramicroscopy 196, 142–153 (2019).10.1016/j.ultramic.2018.10.011CrossRefGoogle Scholar