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Quantification of Electron Beam Heating Effect in TEM

Published online by Cambridge University Press:  04 August 2017

Hua Guo ,
Panpan Zhou ,
Douglas Natelson  and
Jun Lou
Hua Guo
Affiliation:
Department of Materials Science and NanoEngineering, Rice University, Houston, Texas, USA
Panpan Zhou
Affiliation:
Department of Physics and Astronomy, Rice University, Houston, Texas, USA
Douglas Natelson
Affiliation:
Department of Physics and Astronomy, Rice University, Houston, Texas, USA
Jun Lou
Affiliation:
Department of Materials Science and NanoEngineering, Rice University, Houston, Texas, USA

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 1766 - 1767
Copyright
© Microscopy Society of America 2017 

References

[1] Hobbs, L.W. in Introduction to Analytical Electron Microscopy (ed. J.J. Hren, J.I. Goldstern & D.C. JoyPlenum Press New Yorkp. 437.Google Scholar
[2] Bethe, H.A. & Ashkin, J. in Experimental Nuclear Physics (ed. E. SegreJohn Willey & Sons, Inc. New Yorkp. 252.Google Scholar
[3] Guo, H., et al, Nature Communications 5 2014). p. 4986.CrossRefGoogle Scholar
[4] Eyert, V. Annalen der Physik 11 2002). p. 650.CrossRefGoogle Scholar