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Pulsed Electron Beams for Mitigating Damage in Next-generation Electronic Materials

Published online by Cambridge University Press:  30 July 2020

Elisah VandenBussche ,
Catherine Clark ,
Russell Holmes  and
David Flannigan
Elisah VandenBussche
Affiliation:
University of Minnesota, Minneapolis, Minnesota, United States
Catherine Clark
Affiliation:
University of Minnesota, Minneapolis, Minnesota, United States
Russell Holmes
Affiliation:
University of Minnesota, Minneapolis, Minnesota, United States
David Flannigan
Affiliation:
University of Minnesota, Minneapolis, Minnesota, United States

Abstract

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Type
Bridging the Fundamental Electron Dose Gap for Observing Atom Processes in Complex Materials in their Native Environments
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 2866 - 2868
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Copyright
Copyright © Microscopy Society of America 2020

References

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This material is based on work supported by the U.S. Department of Energy, Office of Science, Office of Basic Energy Sciences under Award No. DE-SC0018204. This material is based upon work supported by the National Science Foundation Graduate Research Fellowship Program under Grant No. DGE-1348264.Google Scholar