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Project Tomo: Toward Atomic-scale Analytical Tomography

Published online by Cambridge University Press:  30 July 2020

Thomas Kelly ,
Rafal Dunin-Borkowski  and
Joachim Meyer
Thomas Kelly
Affiliation:
Steam Instruments, Inc., Madison, Wisconsin, United States
Rafal Dunin-Borkowski
Affiliation:
Forschungszentrum Juelich, Juelich, Nordrhein-Westfalen, Germany
Joachim Meyer
Affiliation:
Rhineland Westfalia Technical University (RWTH), Aachen, Nordrhein-Westfalen, Germany

Abstract

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Type
Collaborative Analysis Using Atom Probe Tomography Including TEM/APT Characterization of Metal Alloys and Other Material Systems
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 2618 - 2621
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Copyright
Copyright © Microscopy Society of America 2020

References

Xu, R, Chen, C-C, Wu, L, Scott, MC, Theis, W, Ophus, C, Bartels, M, Yang, Y, Ramezani-Dakhel, H, Sawaya, MR, Heinz, H, Marks, LD, Ercius, P, Miao, J (2015) Three-dimensional coordinates of individual atoms in materials revealed by electron tomography. Nat Mater.10.1038/nmat4426CrossRefGoogle ScholarPubMed
Yang, Y, Chen, C-C, Scott, MC, Ophus, C, Xu, R, Pryor, A, Wu, L, Sun, F, Theis, W, Zhou, J, Eisenbach, M, Kent, PRC, Sabirianov, RF, Zeng, H, Ercius, P, Miao, J (2017) Deciphering chemical order/disorder and material properties at the single-atom level. Nature 542:75–79.10.1038/nature21042CrossRefGoogle ScholarPubMed
Kelly, TF, Miller, MK, Rajan, K, Ringer, SP (2013) Atomic-Scale Tomography: a 2020 Vision. Microsc Microanal 19:652–66410.1017/S1431927613000494CrossRefGoogle ScholarPubMed
McDermott, RF, Suttle, JR (2015) US Patent: System and Method for Characterizing Ions Using a Superconducting Transmission Line Detector. US Patent 9490112Google Scholar
Suttle, J (2018) A Superconducting Ion Detector. Ph.D., The University of Wisconsin - MadisonGoogle Scholar
We put 100% in quotation marks because all real experiments have noise and other limitations. We expect to approach the ideal of 100% with detection efficiencies that may be 99.9%, for example.Google Scholar
Migunov, V, London, A, Farle, M and Dunin-Borkowski R, E (2015) Model-independent measurement of the charge density in an Fe atom probe needle using off-axis electron holography without mean inner potential effects. J. Appl. Phys. 117: 134301.10.1063/1.4916609CrossRefGoogle Scholar
Zheng, F, Caron, J, Migunov, V, Beleggia, M, Pozzi, G and Dunin-Borkowski, R E (2020) Charge density measurement in nanoscale materials using off-axis electron holography. Journal of Electron Spectroscopy and Related Phenomena, in press.10.1016/j.elspec.2019.07.002CrossRefGoogle Scholar
Wu, M, Tafel, A, Hommelhoff, P and Spiecker, E (2019) Determination of 3D electrostatic field at an electron nano-emitter. Appl. Phys. Lett. 114: 013101.10.1063/1.5055227CrossRefGoogle Scholar
https://www.thermofisher.com/us/en/home/industrial/electron-microscopy/electron-microscopy-instruments-workflow-solutions/spectra-300-s-tem.htmlGoogle Scholar
Project Tomo is funded as part of the Ernst Ruska-Centre 2.0 project, which is funded by the federal and state ministries in Germany and the Helmholtz Association.Google Scholar