Hostname: page-component-586b7cd67f-dlnhk Total loading time: 0 Render date: 2024-11-23T15:44:59.690Z Has data issue: false hasContentIssue false
  • English
  • Français

Problems Concerning Application of Electron-Holography Observation of P-N Junctions from the Viewpoint of the Semiconductor Industry

Published online by Cambridge University Press:  01 August 2003

Tsukasa Hirayama ,
Zhouguang Wang ,
Takeharu Kato ,
Naoko Kato ,
Katsuhiro Sasaki  and
Hiroyasu Saka
Tsukasa Hirayama
Affiliation:
Japan Fine Ceramics Center (JFCC), Nagoya, 456-8587, Japan
Zhouguang Wang
Affiliation:
Japan Fine Ceramics Center (JFCC), Nagoya, 456-8587, Japan
Takeharu Kato
Affiliation:
Japan Fine Ceramics Center (JFCC), Nagoya, 456-8587, Japan
Naoko Kato
Affiliation:
ITES, IBM Japan, Yasu, Shiga-ken, Japan
Katsuhiro Sasaki
Affiliation:
Department of Quantum Engineering, Nagoya University, Nagoya 464-8603, Japan
Hiroyasu Saka
Affiliation:
Department of Quantum Engineering, Nagoya University, Nagoya 464-8603, Japan

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 9 , Issue S02 , August 2003 , pp. 770 - 771
Copyright
Copyright © Microscopy Society of America 2003