Hostname: page-component-586b7cd67f-2brh9 Total loading time: 0 Render date: 2024-11-23T20:56:55.647Z Has data issue: false hasContentIssue false
  • English
  • Français

Probe Shaping for Quantitative DPC-STEM Using Segmented Detectors

Published online by Cambridge University Press:  01 August 2018

L. Clark ,
H.G. Brown ,
D.M. Paganin ,
M.J. Morgan ,
T. Matsumoto ,
N. Shibata ,
T.C. Petersen  and
S.D. Findlay
L. Clark
Affiliation:
School of Physics and Astronomy, Monash University, Victoria, Australia
H.G. Brown
Affiliation:
School of Physics and Astronomy, Monash University, Victoria, Australia
D.M. Paganin
Affiliation:
School of Physics and Astronomy, Monash University, Victoria, Australia
M.J. Morgan
Affiliation:
School of Physics and Astronomy, Monash University, Victoria, Australia
T. Matsumoto
Affiliation:
Institute of Engineering Innovation, University of Tokyo, Tokyo, Japan
N. Shibata
Affiliation:
Institute of Engineering Innovation, University of Tokyo, Tokyo, Japan
T.C. Petersen
Affiliation:
School of Physics and Astronomy, Monash University, Victoria, Australia
S.D. Findlay
Affiliation:
School of Physics and Astronomy, Monash University, Victoria, Australia

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 916 - 917
Copyright
© Microscopy Society of America 2018 

References

[1] McMullan, G, et al, Ultramicroscopy 109 2009) p 1126.Google Scholar
[2] Tate, MW, et al, Microscopy and Microanalysis 22 2016) p 237.Google Scholar
[3] Ryll, H, et al, Journal of Instrumentation 11 2016 04006.Google Scholar
[4] Ophus, C, et al, Nature Communications 7 2016) p 10719.Google Scholar
[5] Clark, L, et al arXiv:1801.07572 2018.Google Scholar
[6] Verbeeck, J, Tian, H Schattschneider, P 467 2010) p 301.Google Scholar
[7] Clark, L, et al, Physical Review Letters 111 2013 064801.Google Scholar
[8] Shiloh, R, et al, Ultramicroscopy 144 2014) p 26.Google Scholar
[9] McMorran, BJ, et al, FEMMS conference 2017) p 25.Google Scholar
[10] This research was supported by the Australian Research Council Discovery Projects funding scheme (Project DP160102338). N.S. acknowledges support from SENTAN, JST and JSPS KAKENHI Grant numbers JP26289234 and JP17H01316. The GaAs p-n junction samples were provided by Hirokazu Sasaki, Furukawa Electric Co., Ltd.Google Scholar