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Portable Electron Microscopy and Microanalysis in Extreme Environments

Published online by Cambridge University Press:  04 August 2017

Christopher S. Own ,
Matthew F. Murfitt ,
Lawrence S. Own ,
Jesse Cushing ,
James Martinez ,
Katherine Thomas-Keprta  and
Donald R. Pettit
Christopher S. Own
Affiliation:
Voxa, Seattle, WA, USA.
Matthew F. Murfitt
Affiliation:
Voxa, Seattle, WA, USA.
Lawrence S. Own
Affiliation:
Voxa, Seattle, WA, USA.
Jesse Cushing
Affiliation:
Voxa, Seattle, WA, USA.
James Martinez
Affiliation:
Jacobs/JETS NASA Johnson Space Center, Houston, TX, USA.
Katherine Thomas-Keprta
Affiliation:
Jacobs/JETS NASA Johnson Space Center, Houston, TX, USA.
Donald R. Pettit
Affiliation:
NASA Johnson Space Center, Houston, TX, USA.

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 1082 - 1083
Copyright
© Microscopy Society of America 2017 

References

[1] Own, CS, et al, Microscopy & Microanalysis 2015). p. 57.Google Scholar
[2] Own, CS & Murfitt, MF US Patent No. 9,564,291 (2017)..Google Scholar
[3] Fontana, P, Pettit, D & Cristoforetti, S Journal of Crystal Growth 428 2015). p. 80.Google Scholar
[4] Fontana, P, Schefer, J & Pettit, D Journal of Crystal Growth 324 2011). p. 207.Google Scholar
[5] Own, CS US Patent App No. 14/607,079 (2015)..Google Scholar
[6] This work was supported by Voxa, NASA, and Jacobs.Google Scholar