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Point Defects and Complexes in Gallium Oxide Materials and Devices

Published online by Cambridge University Press:  30 July 2020

Jared Johnson ,
Hsien-Lien Huang  and
Jinwoo Hwang
Jared Johnson
Affiliation:
The Ohio State University, Columbus, Ohio, United States
Hsien-Lien Huang
Affiliation:
The Ohio State University, Columbus, Ohio, United States
Jinwoo Hwang
Affiliation:
The Ohio State University, Columbus, Ohio, United States

Abstract

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Type
Advances in Electron Microscopy to Characterize Materials Embedded in Devices
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 838 - 839
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Copyright
Copyright © Microscopy Society of America 2020

References

Johnson, Jared M., Chen, Zhen, Varley, Joel B., Jackson, Christine M., Farzana, Esmat, Zhang, Zeng, Arehart, Aaron R., Huang, Hsien-Lien, Genc, Arda, Ringel, Steven A., Van de Walle, Chris G., Muller, David A., and Hwang, Jinwoo, Physical Review X 9, 041027 (2019).10.1103/PhysRevX.9.041027CrossRefGoogle Scholar
Varley, B., Peelaers, H., Janotti, A., and Van de Walle, C. G., J. Phys. Condens. Matter 23, 334212 (2011).10.1088/0953-8984/23/33/334212CrossRefGoogle Scholar