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Phase Identification in Aged Catalysts Using STEM Depth Sectioning and Electron Energy-Loss Spectroscopy
Published online by Cambridge University Press: 30 July 2021
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- Type
- Microscopy and Microanalysis for Real World Problem Solving
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- Copyright
- Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America
References
Yao, H. C., Japar, S., and Shelef, M., “Surface interactions in the system RhAl2O3,” J. Catal., vol. 50, no. 3, pp. 407–418, 1977.CrossRefGoogle Scholar
Yao, H. C., Stepien, H. K., and Gandhi, H. S., “Metal-support interaction in automotive exhaust catalysts: Rh-washcoat interaction,” J. Catal., vol. 61, no. 2, pp. 547–550, 1980.CrossRefGoogle Scholar
Wong, C. and McCabe, R. W., “Effects of high-temperature oxidation and reduction on the structure and activity of Rh/Al2O3 and Rh/SiO2 catalysts,” J. Catal., vol. 119, no. 1, pp. 47–64, 1989.CrossRefGoogle Scholar
Chen, J. G., Colaianni, M. L., Chen, P., Yates, J. T., and Fisher, G. B., “Thermal behavior of a rhodium/alumina model catalyst: disappearance of surface rhodium upon heating,” J. Phys. Chem., vol. 94, no. 12, pp. 5059–5062, Jun. 1990.CrossRefGoogle Scholar
Mccabe, R. W., Usmen, R. K., Ober, K., and Gandhi, H. S., “The Effect of Alumina Phase-Structure on the Dispersion of Rhodium/Alumina Catalysts,” J. Catal., vol. 151, no. 2, pp. 385–393, 1995.CrossRefGoogle Scholar
Beck, D. D., Capehart, T. W., Wong, C., and Belton, D. N., “XAFS Characterization of Rh/Al2O3 After Treatment in High-Temperature Oxidizing Environments,” J. Catal., vol. 144, no. 1, pp. 311–324, 1993.CrossRefGoogle Scholar
Ishikawa, R., Pennycook, S. J., Lupini, A. R., Findlay, S. D., Shibata, N., and Ikuhara, Y., “Single atom visibility in STEM optical depth sectioning,” Appl. Phys. Lett., vol. 109, no. 16, p. 163102, Oct. 2016.CrossRefGoogle Scholar
Hovden, R., Xin, H. L., and Muller, D. A., “Extended Depth of Field for High-Resolution Scanning Transmission Electron Microscopy,” Microsc. Microanal., vol. 17, no. 1, pp. 75–80, 2011.CrossRefGoogle ScholarPubMed
Li, C.-H., Wu, J., and Jinschek, J., “Revealing the Atomic Structure of Rh/γ-Al2O3 Catalysts Using Low Dose Rate Electron Microscopy,” Microsc. Microanal., vol. 26, no. S2, pp. 3072–3074, 2020.CrossRefGoogle Scholar
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