Hostname: page-component-586b7cd67f-dsjbd Total loading time: 0 Render date: 2024-11-26T12:33:21.600Z Has data issue: false hasContentIssue false
  • English
  • Français

Online Throughput Monitoring of Transmission Electron Microscopy Research Centers

Published online by Cambridge University Press:  30 July 2020

Lambertus Michael Alink ,
Robert Gheorghita ,
Edward Eng ,
Mykhailo Kopylov ,
Bridget Carragher  and
Clint Potter
Lambertus Michael Alink
Affiliation:
New York Structural Biology Center, New York, New York, United States
Robert Gheorghita
Affiliation:
New York Structural Biology Center, New York, New York, United States
Edward Eng
Affiliation:
New York Structural Biology Center, New York, New York, United States
Mykhailo Kopylov
Affiliation:
New York Structural Biology Center, New York, New York, United States
Bridget Carragher
Affiliation:
New York Structural Biology Center, New York, New York, United States
Clint Potter
Affiliation:
New York Structural Biology Center, New York, New York, United States

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Biomedical and Pharmaceutical Research on the Development, Diagnosis, Prevention, and Treatment of Diseases
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 2256 - 2257
Check for updates
Copyright
Copyright © Microscopy Society of America 2020

References

Cheng, Anchi, Eng, Edward T., Alink, Lambertus, Rice, William J., Jordan, Kelsey D., Kim, Laura Y., Potter, Clinton S., and Carraggher, Bridget. 2018. “High Resolution Single Particle Cryo-Electron Microscopy Using Beam-Image Shift.” BioRxiv, April, 306241. https://doi.org/10.1101/306241CrossRefGoogle Scholar