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On Mass-Thickness Contrast in Annular Dark-Field STEM-in-SEM Images

Published online by Cambridge University Press:  04 August 2017

Jason Holm  and
Ryan White
Jason Holm
Affiliation:
Applied Chemical and Materials Division, National Institute of Standards and Technology, Boulder, United States.
Ryan White
Affiliation:
Applied Chemical and Materials Division, National Institute of Standards and Technology, Boulder, United States.

Abstract

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Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 600 - 601
Copyright
© Microscopy Society of America 2017 

References

[1] Morandi, V. & Merli, P. J. Appl. Phys 101 2007 114917.Google Scholar
[2] Holm, J. & Keller, R. Ultramicroscopy 167 2016 43–56.Google Scholar
[3] This work is a contribution of the US Government and is not subject to United States copyright.Google Scholar