Hostname: page-component-586b7cd67f-t7czq Total loading time: 0 Render date: 2024-11-23T10:29:42.455Z Has data issue: false hasContentIssue false

On Mass-Thickness Contrast in Annular Dark-Field STEM-in-SEM Images

Published online by Cambridge University Press:  04 August 2017

Jason Holm
Affiliation:
Applied Chemical and Materials Division, National Institute of Standards and Technology, Boulder, United States.
Ryan White
Affiliation:
Applied Chemical and Materials Division, National Institute of Standards and Technology, Boulder, United States.

Abstract

Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Copyright
© Microscopy Society of America 2017 

References

[1] Morandi, V. & Merli, P. J. Appl. Phys 101 2007 114917.Google Scholar
[2] Holm, J. & Keller, R. Ultramicroscopy 167 2016 4356.Google Scholar
[3] This work is a contribution of the US Government and is not subject to United States copyright.Google Scholar