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Novel Ion Species: An Exploratory Study of an Unknown Application Space
Published online by Cambridge University Press: 30 July 2020
Abstract
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- Type
- FIB-SEM Technology and Electron Tomography for Materials Science and Engineering
- Information
- Copyright
- Copyright © Microscopy Society of America 2020
References
Winiarski, B., Rue, C., & Withers, P. (2019). Plasma FIB Spin Milling for Large Volume Serial Sectioning Tomography. Microscopy and Microanalysis, 25(S2), 350-351. doi:10.1017/S1431927619002484CrossRefGoogle Scholar
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