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No compromise in correlative microscopy: One sample, one preparation protocol for CLSM and TEM

Published online by Cambridge University Press:  16 July 2003

S.S. Biel ,
K. Kawaschinski ,
K.P. Wittern ,
U. Hintze  and
R. Wepf
S.S. Biel
Affiliation:
Beiersdorf AG, Analytical Microscopy Dept., 20245 Hamburg, Germany
K. Kawaschinski
Affiliation:
Beiersdorf AG, Analytical Microscopy Dept., 20245 Hamburg, Germany
K.P. Wittern
Affiliation:
Beiersdorf AG, Analytical Microscopy Dept., 20245 Hamburg, Germany
U. Hintze
Affiliation:
Beiersdorf AG, Analytical Microscopy Dept., 20245 Hamburg, Germany
R. Wepf
Affiliation:
Beiersdorf AG, Analytical Microscopy Dept., 20245 Hamburg, Germany

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 9 , Issue S02 , August 2003 , pp. 1198 - 1199
Copyright
Copyright © Microscopy Society of America 2003