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A Newly Developed PC controlled 200kV FE-TEM

Published online by Cambridge University Press:  01 August 2003

K. Okamoto ,
Y. Ohkura ,
M. Naruse ,
K. Hasegawa ,
S. Deguchi ,
M. Kawazoe  and
M. Kersker
K. Okamoto
Affiliation:
JEOL Ltd., 1-2, Musashino 3-chome, Akishima, Tokyo, 196-8558, Japan
Y. Ohkura
Affiliation:
JEOL Ltd., 1-2, Musashino 3-chome, Akishima, Tokyo, 196-8558, Japan
M. Naruse
Affiliation:
JEOL Ltd., 1-2, Musashino 3-chome, Akishima, Tokyo, 196-8558, Japan
K. Hasegawa
Affiliation:
JEOL Ltd., 1-2, Musashino 3-chome, Akishima, Tokyo, 196-8558, Japan
S. Deguchi
Affiliation:
JEOL Ltd., 1-2, Musashino 3-chome, Akishima, Tokyo, 196-8558, Japan
M. Kawazoe
Affiliation:
JEOL Ltd., 1-2, Musashino 3-chome, Akishima, Tokyo, 196-8558, Japan
M. Kersker
Affiliation:
JEOL USA Inc., 11 Dearborn Road, Peabody, MA 01960, USA

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 9 , Issue S02 , August 2003 , pp. 1272 - 1273
Copyright
Copyright © Microscopy Society of America 2003