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New Single Photon Sources by Optoelectronic Tailoring of 2D Materials Using Low Energy Ion Implantation

Published online by Cambridge University Press:  30 July 2020

Michael Hennessy ,
Eoghan O'Connell ,
Stefan Rost ,
Manuel Auge ,
Eoin Moynihan ,
Minh Bui ,
Hans Hofsaess ,
Beata Kardynal  and
Ursel Bangert
Michael Hennessy
Affiliation:
University of Limerick, Limerick, Limerick, Ireland
Eoghan O'Connell
Affiliation:
University of Limerick, Limerick, Limerick, Ireland
Stefan Rost
Affiliation:
Peter Grünberg Institute, Jülich, Nordrhein-Westfalen, Germany
Manuel Auge
Affiliation:
Georg-August-Universität, Göttingen, Niedersachsen, Germany
Eoin Moynihan
Affiliation:
University of Limerick, Limerick, Limerick, Ireland
Minh Bui
Affiliation:
Peter Grünberg Institute, Jülich, Nordrhein-Westfalen, Germany
Hans Hofsaess
Affiliation:
Georg-August-Universität, Göttingen, Niedersachsen, Germany
Beata Kardynal
Affiliation:
Peter Grünberg Institute, Jülich, Nordrhein-Westfalen, Germany
Ursel Bangert
Affiliation:
University of Limerick, Limerick, Limerick, Ireland

Abstract

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Type
Advances in Microscopy for Quantum Information Sciences
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 2832 - 2833
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Copyright
Copyright © Microscopy Society of America 2020

References

Mak, K., Lee, C., Hone, J., Shan, J., and Heinz, T., Phys. Rev. Lett. 105, 136805 (2010).10.1103/PhysRevLett.105.136805CrossRefGoogle Scholar
Mak, K. F. and Shan, J., Nat. Photonics 10, 216 (2016).10.1038/nphoton.2015.282CrossRefGoogle Scholar
Eisaman, M. D., Fan, J., Migdall, A., Acta Med. Okayama 67, 259 (2013).Google Scholar
Dolui, K., Rungger, I., Das Pemmaraju, C., and Sanvito, S., 1 (2013).Google Scholar
Pham, V. P. and Yeom, G. Y., Adv. Mater. 28, 9024 (2016).10.1002/adma.201506402CrossRefGoogle Scholar
Azcatl, A., Qin, X., Prakash, A., Zhang, C., Cheng, L., Wang, Q., Lu, N., Kim, M. J., Kim, J., Cho, K., Addou, R., Hinkle, C. L., Appenzeller, J., and Wallace, R. M., ArXiv In Press, 1 (2016).Google Scholar
Mayer, J. W., 1973 Int. Electron Devices Meet. 3 (1973).Google Scholar
Uhrmacher, M. and Hofsäss, H., Nucl. Instruments Methods Phys. Res. Sect. B Beam Interact. with Mater. Atoms 240, 48 (2005).10.1016/j.nimb.2005.06.087CrossRefGoogle Scholar
Nord, M., Vullum, P. E., MacLaren, I., Tybell, T., and Holmestad, R., Adv. Struct. Chem. Imaging 3, 9 (2017).10.1186/s40679-017-0042-5CrossRefGoogle Scholar
Tonndorf, P., Schmidt, R., Schneider, R., Kern, J., Buscema, M., Steele, G. A., Castellanos-Gomez, A., van der Zant, H. S. J., Michaelis de Vasconcellos, S., and Bratschitsch, R., Optica 2, 347 (2015).10.1364/OPTICA.2.000347CrossRefGoogle Scholar