Hostname: page-component-586b7cd67f-2plfb Total loading time: 0 Render date: 2024-11-26T18:30:02.438Z Has data issue: false hasContentIssue false
  • English
  • Français

A New Fast Helium Ion Imaging Technique Through Rapid Acquiring and Restoring Using the Point Spread Function Deconvolution Method

Published online by Cambridge University Press:  30 July 2020

Pouya Tavousi ,
Bahar Ahmadi ,
Nicholas May ,
Sunshine Snider-Drysdale ,
Zahra Shahbazi ,
Daniel Di Mase  and
Sina Shahbazmohamadi
Pouya Tavousi
Affiliation:
Univeristy of Connecticut, Storrs, Connecticut, United States
Bahar Ahmadi
Affiliation:
REFINE Lab, University of Connecticut, Storrs, Connecticut, United States
Nicholas May
Affiliation:
REFINE Lab, University of Connecticut, Storrs, Connecticut, United States
Sunshine Snider-Drysdale
Affiliation:
REFINE Lab, University of Connecticut, Storrs, Connecticut, United States
Zahra Shahbazi
Affiliation:
Manhattan College, Riverdale, New York, United States
Daniel Di Mase
Affiliation:
Aerocyonics Inc, East Greenwich, Rhode Island, United States
Sina Shahbazmohamadi
Affiliation:
REFINE Lab, University of Connecticut, Storrs, Connecticut, United States

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Advances in Modeling, Simulation, and Artificial Intelligence in Microscopy and Microanalysis for Physical and Biological Systems
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 1728 - 1731
Check for updates
Copyright
Copyright © Microscopy Society of America 2020

References

Kandel, Y.P., Zotta, M. D., Caferra, A., Moore, R., Lifshin, E., “Measurement of the Electron Beam Point Spread Function (PSF) in a Scanning Electron Microscope (SEM),” Microscopy & Microanalysis 2015.10.1017/S1431927615004298CrossRefGoogle Scholar
Zhang, Y., “Methods for Image Fusion Quality Assessment-A Review, Comparison, and Analysis”, The International Archives of the Photogrammetry, Remote Sensing and Spatial Information Sciences. Vol. XXXVII. Part B7. Beijing 2008Google Scholar
Wang, Z., Bovik, A. C., Sheikh, H. R. and Simoncelli, E. P., “Image quality assessment: from error visibility to structural similarity,” in IEEE Transactions on Image Processing, vol. 13, no. 4, pp. 600-612, April 2004.10.1109/TIP.2003.819861CrossRefGoogle Scholar
Zhang, L., Zhang, L., Mou, X. and Zhang, D., “A comprehensive evaluation of full-reference image quality assessment algorithms,” 2012 19th IEEE International Conference on Image Processing, 2012, pp. 1477-1480.10.1109/ICIP.2012.6467150CrossRefGoogle Scholar
Ye, P. and Doermann, D., “Document Image Quality Assessment: A Brief Survey,” 2013 12th International Conference on Document Analysis and Recognition, 2013, pp. 723-727.10.1109/ICDAR.2013.148CrossRefGoogle Scholar
Zhang, L., Zhang, L., Mou, X. and Zhang, D., “FSIM: A Feature Similarity Index for Image Quality Assessment,” in IEEE Transactions on Image Processing, vol. 20, no. 8, pp. 2378-2386, 2011.10.1109/TIP.2011.2109730CrossRefGoogle ScholarPubMed
Wang, Z., Simoncelli, E. P. and Bovik, A. C., “Multiscale structural similarity for image quality assessment,” The Thrity-Seventh Asilomar Conference on Signals, Systems & Computers, 2003, pp. 1398-1402 Vol.2.Google Scholar
Sheikh, H. R., Bovik, A. C., “A visual information fidelity approach to video quality assessment”, Proc. 1st Int. Workshop Video Processing & Quality Metrics for Consumer Electronics, 2005,23-25.Google Scholar
Chandler, D. M., “Seven challenges in image quality assessment: Past present and future research”, ISRN Signal Process., vol. 2013, pp. 905.Google Scholar
Ward, B. W., Notte, J. A., and Economou, N. P., Helium ion microscope: A new tool for nanoscale microscopy and metrology, J. Vac. Sci. Technol. B 24, 2871–2874.10.1116/1.2357967CrossRefGoogle Scholar
http://www.nanojehm.com/Google Scholar