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New EPMA-XRF Integration Allows Rapid Trace Element Analysis of Geological Materials

Published online by Cambridge University Press:  30 July 2020

Rie Wakimoto ,
Takaomi Yokoyama ,
Kazunori Tsukamoto ,
Koki Kato  and
Vernon Robertson
Rie Wakimoto
Affiliation:
JEOL Ltd., Akishima, Tokyo, Japan
Takaomi Yokoyama
Affiliation:
JEOL Ltd., Akishima, Tokyo, Japan
Kazunori Tsukamoto
Affiliation:
JEOL Ltd., Akishima, Tokyo, Japan
Koki Kato
Affiliation:
JEOL Ltd., Akishima, Tokyo, Japan
Vernon Robertson
Affiliation:
JEOL.Ltd, Peabody, Massachusetts, United States

Abstract

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Type
Call of the Wild: Advances in Microanalysis and Microscopy of Geological and Extraterrestrial Materials
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 1882 - 1883
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Copyright
Copyright © Microscopy Society of America 2020