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New EPMA Applications Utilizing Novel High-current, High-spatial Resolution Field Emission Optics
Published online by Cambridge University Press: 30 July 2020
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- Type
- X-ray, Electron and Synchrotron-Based X-ray Imaging and Analysis
- Information
- Copyright
- Copyright © Microscopy Society of America 2020
References
Fujita, S., Wells, T.R.C., Ushio, W., Ssto, H. and El-Gomati, H.M.: Enhanced angular current intensity from Schottky emitters, J. Microscopy, 239(3),215(2010)10.1111/j.1365-2818.2010.03371.xCrossRefGoogle Scholar
Fujita, S. and Shimoyama, H.: A new evaluation method of electron optical performance of high beam current probe forming systems, J. Electron Microsc., 54(5), 413(2005)Google ScholarPubMed
Shimoyama, H., Nimura, K., Suzuki, M. and Maruse, S.: Magnetic-Field-Superposed Electron Gun with a Point Cathode, J. Electron Microsc., 32(2), 99(1983)Google Scholar
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