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Microscopy and Modelling to Understand Defects and Phonon Dispersions

Published online by Cambridge University Press:  30 July 2020

Rebecca Nicholls
Rebecca Nicholls*
Affiliation:
University of Oxford, Oxford, England, United Kingdom

Abstract

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Type
Pushing the Limits of Detection in Quantitative (S)TEM Imaging, EELS, and EDX
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 956
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Copyright
Copyright © Microscopy Society of America 2020

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