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Mapping Data with Heavily Overlapped Spectral Features

Published online by Cambridge University Press:  04 August 2017

Philippe Kikongi ,
Hendrix Demers ,
Raynald Gauvin ,
Ryan Gosselin  and
Nadi Braidy
Philippe Kikongi
Affiliation:
Department of Chemical and Biotechnological Engineering, Universite de Sherbrooke, Sherbrooke, Canada.
Hendrix Demers
Affiliation:
Department of Mining and Materials Engineering, McGill University, Montreal, Canada.
Raynald Gauvin
Affiliation:
Department of Mining and Materials Engineering, McGill University, Montreal, Canada.
Ryan Gosselin
Affiliation:
Department of Chemical and Biotechnological Engineering, Universite de Sherbrooke, Sherbrooke, Canada.
Nadi Braidy
Affiliation:
Department of Chemical and Biotechnological Engineering, Universite de Sherbrooke, Sherbrooke, Canada.

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 216 - 217
Copyright
© Microscopy Society of America 2017 

References

[1] Kotula, PG, Keenan, MR & Micheals, JR Microscopy and Microanalysis 9, p 1.CrossRefGoogle Scholar
[2] Lavoie, FB, Braidy, N & Gosselin, R Chemotr Intell Lab 153 2016). p. 40.Google Scholar
[3] Gauvin, R & Michaud, P Microscopy and Microanalysis 15 2009). p. 488.Google Scholar