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Mapping Anti-phase Domains by Polarity Sensitive Orientation Imaging Using Electron Backscatter Diffraction

Published online by Cambridge University Press:  04 August 2017

G. Naresh-Kumar ,
S. Vespucci ,
A. Vilalta-Clemente ,
H. Jussila ,
A. Winkelmann ,
G. Nolze ,
S. Nagarajan ,
A. J. Wilkinson  and
C. Trager-Cowan
G. Naresh-Kumar
Affiliation:
Department of Physics, SUPA, University of Strathclyde, Glasgow, UK
S. Vespucci
Affiliation:
Department of Physics, SUPA, University of Strathclyde, Glasgow, UK
A. Vilalta-Clemente
Affiliation:
Department of Materials, University of Oxford, Parks Road, Oxford, UK
H. Jussila
Affiliation:
Department of Micro and Nanosciences, Aalto University, Aalto, Finland
A. Winkelmann
Affiliation:
Bruker Nano GmbH, Am Studio 2D, Berlin, Germany
G. Nolze
Affiliation:
BAM, Unter den Eichen 87, Berlin, Germany
S. Nagarajan
Affiliation:
Department of Micro and Nanosciences, Aalto University, Aalto, Finland
A. J. Wilkinson
Affiliation:
Department of Materials, University of Oxford, Parks Road, Oxford, UK
C. Trager-Cowan
Affiliation:
Department of Physics, SUPA, University of Strathclyde, Glasgow, UK

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 1522 - 1523
Copyright
© Microscopy Society of America 2017 

References

[1] Winkelmann, A. & Nolze, G. Applied Physics Letters 106 2015). p. 072101.Google Scholar
[2] Nolze, G., Grosse, C. & Winkelmann, A. Journal of Applied Crystallography 48 2015). p. 1405.CrossRefGoogle Scholar
[3] Wilkinson, A. J., Meaden, G. & Dingley, D. J. Ultramicroscopy. 106 2006). p. 307.Google Scholar