Hostname: page-component-5c6d5d7d68-vt8vv Total loading time: 0.001 Render date: 2024-08-22T01:22:26.688Z Has data issue: false hasContentIssue false

Machine Learning Assisted Pattern Matching: Insight into Oxide Electronic Device Performance by Phase Determination in 4D-STEM Datasets

Published online by Cambridge University Press:  30 July 2020

Alexander Zintler
Affiliation:
Technical University of Darmstadt, Darmstadt, Hessen, Germany
Robert Eilhardt
Affiliation:
Technical University of Darmstadt, Darmstadt, Hessen, Germany
Shuai Wang
Affiliation:
Technical University of Darmstadt, Darmstadt, Hessen, Germany
Matus Krajnak
Affiliation:
Quanum Detectors Ltd., Harwell Oxford, England, United Kingdom
Patrick Schramowski
Affiliation:
Technical University of Darmstadt, Darmstadt, Hessen, Germany
Wolfgang Stammer
Affiliation:
Technical University of Darmstadt, Darmstadt, Hessen, Germany
Stefan Petzold
Affiliation:
Technical University of Darmstadt, Darmstadt, Hessen, Germany
Nico Kaiser
Affiliation:
Technical University of Darmstadt, Darmstadt, Hessen, Germany
Kristian Kersting
Affiliation:
Technical University of Darmstadt, Darmstadt, Hessen, Germany
Lambert Alff
Affiliation:
Technical University of Darmstadt, Darmstadt, Hessen, Germany
Leopoldo Molina-Luna
Affiliation:
Technical University of Darmstadt, Darmstadt, Hessen, Germany

Abstract

Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Four-dimensional Scanning Transmission Electron Microscopy (4D-STEM): New Experiments and Data Analyses for Determining Materials Functionality and Biological Structures
Copyright
Copyright © Microscopy Society of America 2020

References

Petzold, S, Zintler, A, et al. ., Adv. Electron. Mater. 10 (2019) 10.1002/aelm.201900484Google Scholar
Xue, K-H, Blaise, P, et al. , Appl. Phys. Lett. 20 (2013) 10.1063/1.4807666Google Scholar
McKenna, K, Shluger, A, Appl. Phys. Lett. 22 (2009) 10.1063/1.3271184Google Scholar
Ophus, C, Microsc. Microanal. 3 (2019) 10.1017/S1431927619000497Google Scholar
Johnstone, Duncan N., Crout, Phillip, et al. ., (2020) 10.5281/zenodo.3667613Google Scholar
Borodinov, N., Neumayer, , et al. npj Comput Mater 5, 25 (2019). 10.1038/s41524-019-0148-5Google Scholar
The authors acknowledge financial support from the Deutsche Forschungsgemeinschaft (DFG) under research grant MO 3010/3-1 and the European Research Council (ERC) “Horizon 2020” Program under Grant No. 805359-FOXON.Google Scholar