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Machine Learning Assisted Pattern Matching: Insight into Oxide Electronic Device Performance by Phase Determination in 4D-STEM Datasets
Published online by Cambridge University Press: 30 July 2020
Abstract
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- Type
- Four-dimensional Scanning Transmission Electron Microscopy (4D-STEM): New Experiments and Data Analyses for Determining Materials Functionality and Biological Structures
- Information
- Copyright
- Copyright © Microscopy Society of America 2020
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