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Layer Count Mapping of Multilayer Hexagonal Boron Nitride Thin Films

Published online by Cambridge University Press:  04 August 2017

Nicholas Cross ,
Ali Mohsin ,
Lei Liu ,
Gong Gu  and
Gerd Duscher
Nicholas Cross
Affiliation:
Materials Science and Engineering Department, University of Tennessee, Knoxville, Tennessee 37996, United States
Ali Mohsin
Affiliation:
Electrical Engineering and Computer Science Department, University of Tennessee, Knoxville, Tennessee 37996, United States
Lei Liu
Affiliation:
Electrical Engineering and Computer Science Department, University of Tennessee, Knoxville, Tennessee 37996, United States
Gong Gu
Affiliation:
Electrical Engineering and Computer Science Department, University of Tennessee, Knoxville, Tennessee 37996, United States
Gerd Duscher
Affiliation:
Materials Science and Engineering Department, University of Tennessee, Knoxville, Tennessee 37996, United States Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, United States

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 412 - 413
Copyright
© Microscopy Society of America 2017 

References

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[2] Ismach, Ariel, Chou, Harry & Ferrer, Domingo ACS Nano 6 2012). p. 6378.CrossRefGoogle Scholar
[3] Jesson, D. E. & Pennycook, S. J. Proceedings: Mathematical and Physical Sciences 449 1995). p 273.Google Scholar
[4] The authors acknowledge funding from the NSF grant #DMR-1410940.Google Scholar