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Layer Count Mapping of Multilayer Hexagonal Boron Nitride Thin Films

Published online by Cambridge University Press:  04 August 2017

Nicholas Cross
Affiliation:
Materials Science and Engineering Department, University of Tennessee, Knoxville, Tennessee 37996, United States
Ali Mohsin
Affiliation:
Electrical Engineering and Computer Science Department, University of Tennessee, Knoxville, Tennessee 37996, United States
Lei Liu
Affiliation:
Electrical Engineering and Computer Science Department, University of Tennessee, Knoxville, Tennessee 37996, United States
Gong Gu
Affiliation:
Electrical Engineering and Computer Science Department, University of Tennessee, Knoxville, Tennessee 37996, United States
Gerd Duscher
Affiliation:
Materials Science and Engineering Department, University of Tennessee, Knoxville, Tennessee 37996, United States Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, United States

Abstract

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Type
Abstract
Copyright
© Microscopy Society of America 2017 

References

[1] Song, Li, Ci, Lijie & Lu, Hao Nano Letters 10 2010). p. 3209.CrossRefGoogle Scholar
[2] Ismach, Ariel, Chou, Harry & Ferrer, Domingo ACS Nano 6 2012). p. 6378.CrossRefGoogle Scholar
[3] Jesson, D. E. & Pennycook, S. J. Proceedings: Mathematical and Physical Sciences 449 1995). p 273.Google Scholar
[4] The authors acknowledge funding from the NSF grant #DMR-1410940.Google Scholar