Hostname: page-component-586b7cd67f-vdxz6 Total loading time: 0 Render date: 2024-11-26T03:35:18.125Z Has data issue: false hasContentIssue false
  • English
  • Français

Lattice parameter measurement by CBED: Accuracy limited by the noise

Published online by Cambridge University Press:  05 September 2003

Andrey Chuvilin ,
Thomas Kups  and
Ute Kaiser
Andrey Chuvilin
Affiliation:
Institute of Solid State Physics, Friedrich Schiller University Jena, Max-Wien-Platz 1, Jena D-07743, Germany
Thomas Kups
Affiliation:
Institute of Solid State Physics, Friedrich Schiller University Jena, Max-Wien-Platz 1, Jena D-07743, Germany
Ute Kaiser
Affiliation:
Institute of Solid State Physics, Friedrich Schiller University Jena, Max-Wien-Platz 1, Jena D-07743, Germany
Get access

Abstract

An abstract is not available for this content so a preview has been provided. Please use the Get access link above for information on how to access this content.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Invited Papers
Information
Microscopy and Microanalysis , Volume 9 , Issue S03 , September 2003 , pp. 356 - 357
Copyright
Copyright © Microscopy Society of America 2003

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)