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Introduction to the Capabilities and Applications of the World's Largest Chamber Scanning Electron Microscope

Published online by Cambridge University Press:  01 August 2005

S Dekanich ,
J Frafjord ,
D Carpenter  and
B Bolinger
S Dekanich
Affiliation:
Y-12 National Security Complex, Oak Ridge, Tennessee
J Frafjord
Affiliation:
Y-12 National Security Complex, Oak Ridge, Tennessee
D Carpenter
Affiliation:
Y-12 National Security Complex, Oak Ridge, Tennessee
B Bolinger
Affiliation:
Y-12 National Security Complex, Oak Ridge, Tennessee

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Type
Research Article
Information
Microscopy and Microanalysis , Volume 11 , Issue S02 , August 2005 , pp. 762 - 763
Copyright
© 2005 Microscopy Society of America