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In-situ TEM Observations of Resistance Switching in Strontium Titanate Devices

Published online by Cambridge University Press:  03 December 2021

Houari Amari ,
Tobias Schulz ,
Aykut Baki ,
Julian Stöver ,
Carsten Richter ,
Jens Martin ,
Klaus Irmscher ,
Jutta Schwarzkopf  and
Martin Albrecht
Houari Amari
Affiliation:
Leibniz-Institute for Crystal Growth, Max-Born-Straße 2, 12489Berlin, Germany.
Tobias Schulz
Affiliation:
Leibniz-Institute for Crystal Growth, Max-Born-Straße 2, 12489Berlin, Germany.
Aykut Baki
Affiliation:
Leibniz-Institute for Crystal Growth, Max-Born-Straße 2, 12489Berlin, Germany.
Julian Stöver
Affiliation:
Vishay Siliconix GmbH, Fraunhoferstraße 1A, 25524Itzehoe, Germany.
Carsten Richter
Affiliation:
Leibniz-Institute for Crystal Growth, Max-Born-Straße 2, 12489Berlin, Germany.
Jens Martin
Affiliation:
Leibniz-Institute for Crystal Growth, Max-Born-Straße 2, 12489Berlin, Germany.
Klaus Irmscher
Affiliation:
Leibniz-Institute for Crystal Growth, Max-Born-Straße 2, 12489Berlin, Germany.
Jutta Schwarzkopf
Affiliation:
Leibniz-Institute for Crystal Growth, Max-Born-Straße 2, 12489Berlin, Germany.
Martin Albrecht
Affiliation:
Leibniz-Institute for Crystal Growth, Max-Born-Straße 2, 12489Berlin, Germany.

Abstract

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Type
Posters
Information
Microscopy and Microanalysis , Volume 27 , Supplement S2: Proceedings of CISCEM 2021 - the 5th Conference on In-Situ and Correlative Electron Microscopy , November 2021 , pp. 69 - 70
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Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

References:

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