No CrossRef data available.
Article contents
In-situ TEM Investigation of the Amorphous to Crystalline Phase Change During Electrical Breakdown of Highly Conductive Polymers at the Atomic Scale
Published online by Cambridge University Press: 30 July 2020
Abstract
An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
- Type
- In Situ TEM at the Extremes - Extreme Temperature and Biasing
- Information
- Copyright
- Copyright © Microscopy Society of America 2020
References
Lin, , Zhaoyang, Y. H., Nature Electronics 2.9 (2019) 378-388.10.1038/s41928-019-0301-7CrossRefGoogle Scholar
Caironi, M., & Yong-Young, N., Large area and flexible electronics. John Wiley & Sons, 2015.10.1002/9783527679973CrossRefGoogle Scholar
Salvatore, G. A., et al. . Nature communications 5.1 (2014) 1-8.10.1038/ncomms3982CrossRefGoogle Scholar
Liu, Y., Matt, P., & Giovanni, A. S., ACS nano 11.10 (2017): 9614-9635.10.1021/acsnano.7b04898CrossRefGoogle Scholar
Ni, D., et al. . Journal of Materials Chemistry A 7.3 (2019) 1323-1333.10.1039/C8TA08814DCrossRefGoogle Scholar
Fan, Xi, et al. . Advanced Science 6.19 (2019): 1900813.10.1002/advs.201900813CrossRefGoogle Scholar
You have
Access