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In-situ Observation of Out-of-plane Switching Filament in 2D Halide (PbI2)1-x(BiI3)x Memristor Under Operando Biasing

Published online by Cambridge University Press:  30 July 2020

Hee Joon Jung ,
Akshay Murthy ,
Grant Alexander ,
Matthew Cheng ,
Mercouri Kanatzidis  and
Vinayak Dravid
Hee Joon Jung
Affiliation:
Northwestern University, Evanston, Illinois, United States
Akshay Murthy
Affiliation:
Northwestern University, Evanston, Illinois, United States
Grant Alexander
Affiliation:
Northwestern University, Evanston, Illinois, United States
Matthew Cheng
Affiliation:
Northwestern University, Evanston, Illinois, United States
Mercouri Kanatzidis
Affiliation:
Northwestern University, Evanston, Illinois, United States
Vinayak Dravid
Affiliation:
Northwestern University, Evanston, Illinois, United States

Abstract

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Type
Advances in Electron Microscopy to Characterize Materials Embedded in Devices
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 848 - 849
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Copyright
Copyright © Microscopy Society of America 2020

References

Strukov, D. B. et al. , Nature 453 (2008), p. 80–83.10.1038/nature06932CrossRefGoogle Scholar
Cai, F. et al. , Nature Electronics 2 (2019), p. 290–299.10.1038/s41928-019-0270-xCrossRefGoogle Scholar
Sangwan, V. K. et al. , Nature 554 (2018), p. 500–504.10.1038/nature25747CrossRefGoogle Scholar
Zhu, X. et al. , Nature Mater 18 (2019), p. 141–148.10.1038/s41563-018-0248-5CrossRefGoogle Scholar
Yoshida, M. et al. , Science Advances 1, 9 (2015), p. e1500606.10.1126/sciadv.1500606CrossRefGoogle Scholar