Hostname: page-component-586b7cd67f-t8hqh Total loading time: 0 Render date: 2024-11-27T04:31:29.786Z Has data issue: false hasContentIssue false
  • English
  • Français

In-situ Observation of Out-of-plane Switching Filament in 2D Halide (PbI2)1-x(BiI3)x Memristor Under Operando Biasing

Published online by Cambridge University Press:  30 July 2020

Hee Joon Jung ,
Akshay Murthy ,
Grant Alexander ,
Matthew Cheng ,
Mercouri Kanatzidis  and
Vinayak Dravid
Hee Joon Jung
Affiliation:
Northwestern University, Evanston, Illinois, United States
Akshay Murthy
Affiliation:
Northwestern University, Evanston, Illinois, United States
Grant Alexander
Affiliation:
Northwestern University, Evanston, Illinois, United States
Matthew Cheng
Affiliation:
Northwestern University, Evanston, Illinois, United States
Mercouri Kanatzidis
Affiliation:
Northwestern University, Evanston, Illinois, United States
Vinayak Dravid
Affiliation:
Northwestern University, Evanston, Illinois, United States

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Advances in Electron Microscopy to Characterize Materials Embedded in Devices
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 848 - 849
Check for updates
Copyright
Copyright © Microscopy Society of America 2020

References

Strukov, D. B. et al. , Nature 453 (2008), p. 80–83.10.1038/nature06932CrossRefGoogle Scholar
Cai, F. et al. , Nature Electronics 2 (2019), p. 290–299.10.1038/s41928-019-0270-xCrossRefGoogle Scholar
Sangwan, V. K. et al. , Nature 554 (2018), p. 500–504.10.1038/nature25747CrossRefGoogle Scholar
Zhu, X. et al. , Nature Mater 18 (2019), p. 141–148.10.1038/s41563-018-0248-5CrossRefGoogle Scholar
Yoshida, M. et al. , Science Advances 1, 9 (2015), p. e1500606.10.1126/sciadv.1500606CrossRefGoogle Scholar