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Improved Image Quality in SEM Imaging of Thin Tissue Sections

Published online by Cambridge University Press:  04 August 2017

W Zuidema ,
J P Hoogenboom  and
P Kruit
W Zuidema
Affiliation:
Delft University of Technology, Department of Imaging Physics, Delft, the Netherlands.
J P Hoogenboom
Affiliation:
Delft University of Technology, Department of Imaging Physics, Delft, the Netherlands.
P Kruit
Affiliation:
Delft University of Technology, Department of Imaging Physics, Delft, the Netherlands.

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 564 - 565
Copyright
© Microscopy Society of America 2017 

References

[1] Ren, Y. & Kruit, P. Journal of Vacuum Science and Technology B 34 2016.Google Scholar
[2] Eberle, A. L., et al, Journal of Microscopy 259(2 2015). p. 114.Google Scholar
[3] Timischl, F. (2015). SCANNING 37(2014p. 54.Google Scholar