Hostname: page-component-6d856f89d9-mhpxw Total loading time: 0 Render date: 2024-07-16T06:03:27.351Z Has data issue: false hasContentIssue false
  • English
  • Français

Improved Characterization of Steel Samples by SEM/EDS Through the Use of a Silicon Drift Detector

Published online by Cambridge University Press:  04 August 2017

John Konopka
John Konopka*
Affiliation:
Thermo Fisher Scientific, Madison, WI, USA

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 78 - 79
Copyright
© Microscopy Society of America 2017 

References

[1] Gatti, E. & Rehak, P. Nucl. Instrum. Methods A 1984 42, 12.Google Scholar
[2] Fiori, C. E. & Swyt, C. R. Microbeam Analysis 1992 89–95.Google Scholar
[3] Harrowfield, I. R. & MacRae, C. M. Microbeam Analysis 1988 267–270.Google Scholar
[4] Newbury, D. E. & Ritchie, N. W. M. Materials Science and Technology 2016 1017–1023.Google Scholar