Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by Crossref.
Dai, Sheng
Gao, Wenpei
Zhang, Shuyi
Graham, George W.
and
Pan, Xiaoqing
2017.
Transmission electron microscopy with atomic resolution under atmospheric pressures.
MRS Communications,
Vol. 7,
Issue. 4,
p.
798.
Chen, Qiaoli
Dwyer, Christian
Sheng, Guan
Zhu, Chongzhi
Li, Xiaonian
Zheng, Changlin
and
Zhu, Yihan
2020.
Imaging Beam‐Sensitive Materials by Electron Microscopy.
Advanced Materials,
Vol. 32,
Issue. 16,