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Imaging the Structure and Properties of 2D Materials with 4D-STEM

Published online by Cambridge University Press:  30 July 2020

David Muller ,
Zhen Chen ,
Yi Jiang  and
Michal Odstrcil
David Muller
Affiliation:
Cornell University, Ithaca, New York, United States
Zhen Chen
Affiliation:
Cornell University, Ithaca, New York, United States
Yi Jiang
Affiliation:
Argonne National Laboratory, Lemont, Illinois, United States
Michal Odstrcil
Affiliation:
Paul Scherrer Institut, Villigen PSI, Aargau, Switzerland

Abstract

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Type
New Frontiers in Electron Microscopy of Two-dimensional Materials
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 624 - 626
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Copyright
Copyright © Microscopy Society of America 2020

References

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We thank Park, Jiwoong, Xie, Saien, Gao, Hui, Chiu, Ming-Hui, and Li, Lain-Jong for samples. Research supported by US National Science Foundation (grants DMR-1539918, DMR-1719875, DMR-1429155).Google Scholar