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Imaging Nucleation, Growth and Disorder at the Single-atom Level by Atomic Electron Tomography (AET)

Published online by Cambridge University Press:  30 July 2020

Peter Ercius ,
Jihan Zhou ,
Yongsoo Yang ,
Yao Yang ,
Dennis Kim ,
Andrew Yuan ,
Xuezeng Tian ,
Colin Ophus ,
S Zhu  and
Andreas Schmid
...Show all authors
Peter Ercius
Affiliation:
Lawrence Berkeley National Laboratory, Berkeley, California, United States
Jihan Zhou
Affiliation:
University of California-Los Angeles, Los Angeles, California, United States
Yongsoo Yang
Affiliation:
Korea Advanced Institute of Science and Technology, Daejeon, Ch'ungch'ong-bukto, Republic of Korea
Yao Yang
Affiliation:
University of California-Los Angeles, Los Angeles, California, United States
Dennis Kim
Affiliation:
University of California-Los Angeles, Los Angeles, California, United States
Andrew Yuan
Affiliation:
University of California-Los Angeles, Los Angeles, California, United States
Xuezeng Tian
Affiliation:
University of California-Los Angeles, Los Angeles, California, United States
Colin Ophus
Affiliation:
Lawrence Berkeley National Laboratory, Berkeley, California, United States
S Zhu
Affiliation:
University of California-Los Angeles, Los Angeles, California, United States
Andreas Schmid
Affiliation:
Lawrence Berkeley National Laboratory, Berkeley, California, United States
Michael Nathanson
Affiliation:
University of Colorado, Boulder, Boulder, Colorado, United States
Hendrik Heinz
Affiliation:
University of Colorado, Boulder, Boulder, Colorado, United States
Qi An
Affiliation:
University of Nevada, Reno, Reno, Nevada, United States
Hao Zeng
Affiliation:
University of Buffalo, Buffalo, New York, United States
Jianwei Miao
Affiliation:
University of California-Los Angeles, Los Angeles, California, United States

Abstract

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Type
FIB-SEM Technology and Electron Tomography for Materials Science and Engineering
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 1848 - 1850
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Copyright
Copyright © Microscopy Society of America 2020

References

Bacon, D.J. & Hull, D. (eds), “Introduction to Dislocations”, 5th edn, Butterworth- Heinemann (2011).Google Scholar
Ercius, P., Alaidi, O., Rames, M. J. & Ren, G. Electron Tomography: A Three-Dimensional Analytic Tool for Hard and Soft Materials Research. Adv. Mater. 27, 5638–5663 (2015).10.1002/adma.201501015CrossRefGoogle ScholarPubMed
Miao, J., Ercius, P. & Billinge, S. J. L. Atomic electron tomography: 3D structures without crystals. Science 353, aaf2157 (2016).10.1126/science.aaf2157CrossRefGoogle ScholarPubMed
Xu, R. et al. . Three-dimensional coordinates of individual atoms in materials revealed by electron tomography. Nat Mater 14, 1099–1103 (2015).10.1038/nmat4426CrossRefGoogle ScholarPubMed
Yang, Y. et al. . Deciphering chemical order/disorder and material properties at the single-atom level. Nature 542, 75–79 (2017).10.1038/nature21042CrossRefGoogle ScholarPubMed
Zhou, J. et al. . Observing crystal nucleation in four dimensions using atomic electron tomography. Nature 570, 500 (2019).10.1038/s41586-019-1317-xCrossRefGoogle ScholarPubMed