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How to Set Up Your STEM for EELS at Very High Energy Losses

Published online by Cambridge University Press:  04 August 2017

Ian MacLaren ,
Alan J. Craven ,
Colin Black ,
Sam McFadzean  and
Hidetaka Sawada
Ian MacLaren
Affiliation:
School of Physics and Astronomy, University of Glasgow, Glasgow G12 8QQ, UK
Alan J. Craven
Affiliation:
School of Physics and Astronomy, University of Glasgow, Glasgow G12 8QQ, UK
Colin Black
Affiliation:
School of Physics and Astronomy, University of Glasgow, Glasgow G12 8QQ, UK
Sam McFadzean
Affiliation:
School of Physics and Astronomy, University of Glasgow, Glasgow G12 8QQ, UK
Hidetaka Sawada
Affiliation:
JEOL UK Ltd., JEOL House, Silver Court, Watchmead, Welwyn Garden City, Herts. AL7 1LT, UK

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 1080 - 1081
Copyright
© Microscopy Society of America 2017 

References

[1] Craven, A. J. & Buggy, T. W. Ultramicroscopy 7 1981). p. 27.Google Scholar