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High-resolution Nano-imaging with Transmission Nanofocus X-ray Source

Published online by Cambridge University Press:  30 July 2020

Anasuya Adibhatla ,
Tomi Tuohimaa  and
Fei Yang
Anasuya Adibhatla
Affiliation:
Excillum Inc, Arlington, Massachusetts, United States
Tomi Tuohimaa
Affiliation:
Excillum, Kista, Stockholms Lan, Sweden
Fei Yang
Affiliation:
Excillum, Kista, Stockholms Lan, Sweden

Abstract

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Type
Vendor Symposium
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 2722
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Copyright
Copyright © Microscopy Society of America 2020

References

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Balles, A. et al. , X-ray grating interferometry for 9.25 keV design energy at a liquid-metal-jet source, AIP Conference Proceedings 1696, 2016.10.1063/1.4937537CrossRefGoogle Scholar