Hostname: page-component-5c6d5d7d68-pkt8n Total loading time: 0 Render date: 2024-08-26T11:09:43.433Z Has data issue: false hasContentIssue false
  • English
  • Français

High-resolution Multimodal Confocal Raman-imaging in SEM by Means of RISE Microscopy

Published online by Cambridge University Press:  30 July 2020

Jan Englert ,
Ute Schmidt ,
Olaf Hollricher  and
Harald Fischer
Jan Englert
Affiliation:
WITec Wissenschaftliche Instrumente und Technologie GmbH, Ulm, Baden-Wurttemberg, Germany
Ute Schmidt
Affiliation:
WITec Wissenschaftliche Instrumente und Technologie GmbH, Ulm, Baden-Wurttemberg, Germany
Olaf Hollricher
Affiliation:
WITec Wissenschaftliche Instrumente und Technologie GmbH, Ulm, Baden-Wurttemberg, Germany
Harald Fischer
Affiliation:
WITec Wissenschaftliche Instrumente und Technologie GmbH, Ulm, Baden-Wurttemberg, Germany

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Vendor Symposium - Imaging
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 1808 - 1809
Check for updates
Copyright
Copyright © Microscopy Society of America 2020

References

Schmidt, R.; Fitzek, H.; Nachtnebel, M.; Mayrhofer, C.; Schroettner, H.; Zankel, A., The Combination of Electron Microscopy, Raman Microscopy and Energy Dispersive X-Ray Spectroscopy for the Investigation of Polymeric Materials. Macromolecular Symposia 2019, 384 (1), 180023710.1002/masy.201800237CrossRefGoogle Scholar
Wille, G.; Lerouge, C.; Schmidt, U., A multimodal microcharacterisation of trace-element zonation and crystallographic orientation in natural cassiterite by combining cathodoluminescence, EBSD, EPMA and contribution of confocal Raman-in-SEM imaging. Journal of Microscopy 2018, 270, 309-317.10.1111/jmi.12684CrossRefGoogle ScholarPubMed
Schmidt, U.; Hollricher, K.; Ayasse, P.; Hollricher, O., Correlative RISE microscopy: Raman imaging meets scanning electron probe microscopy. Microscopy and Analysis 2015, 29 (3), 24-27.Google Scholar
Stolcova, L.; Prosika, J.; Vana, R.; Dluhos, J., Correlative RISE microscopy and 3D reconstruction. Imaging & Microscopy 2015, 17.Google Scholar
Schmidt, U.; Liu, W.; Yang, J.; Dieing, T.; Weishaupt, K., The power of confocal raman-AFM and raman-SEM (RISE) imaging in polymer research. In Microscopy and Microanalysis, 2015; Vol. 21, pp 2189-2190.10.1017/S1431927615011721CrossRefGoogle Scholar